• Flying Probe (FP)
  • In Circuit Test (ICT)
  • Test Functional (FT)
  • Battery Test
  • Components Devices Programing
  • Test Coverage Analysis & Testability Report
  • Accesories

Discover our innovative Test products and outsourcing service.


We offer an all-inclusive test service that includes support, design, programming, equipment optimization, maintenance, and training, guaranteeing speed, flexibility, and reliability in a fully automated process.

Test
4020 Automatic Flying Probe Tester
High performances at a breakthrough price

Features
Accurate micro-SMD probing
Best Measurement Accuracy
Fast Probe Speed
Test Capabilities

Key Features
Best measurement accuracy
Accurate Micro-SMD contacting
No cost of fixturing
Intuitive programming
Zero errors at functional test
Field returns are practically eliminated
4050 Automatic Flying Probe Tester
High throughput meets best accuracy

Features
Accurate micro-SMD probing
Best Measurement Accuracy
Fast Probe Speed

Key Features
High throughput
Best measurement accuracy
Accurate Micro-SMD probing
No cost of fixturing
Intuitive programming
Zero errors at functional test
Field returns are practically eliminated
4060 Automatic Flying Probe Tester
Test the largest boards

Features
Multi-Mode Dual Side Probing
Test also the biggest ones.
Best Measurement Accuracy
Fast and accurate probing on the smallest components

Key features
Dual side probing: full accessibility & parallel test
Large boards testing: 1000 x 610mm (39.4 x 24’’)
20 kg max board weight
Full test coverage
Conveyor / Automatic / Manual board loading
Micro-SMD & flexible circuit probing
4080 Automatic Flying Probe Tester
The Fastest in the World

Top Features to Achieve the Best Performances:
- The Best Throughput and Accuracy
- Ultra-Fast Double-sided Probing
- Micro-Probing Accuracy for the Smallest Targets
- Safe Probing with Ultra-Soft Touch Technology
- Configurable Multi-Tool Flying Heads
- Automatic Test of Large and Complex Electronic Boards

The 4080 is an 8-probe multi-functional, high-production Flying Probe Tester designed for testing electronic boards and devices. The tester sets a new benchmark for flying probe board testing, offering the highest probing and electrical measurement accuracy and speed on both sides of the device under test.

The 4080 ensures 100% net accessibility and zero-failure escape thanks to SPEA’s Multi-Domain Test Technology, which provides full test coverage for any test application.
3030IL
Multi-core multi-function board tester.
High volumes. High quality. Low cost of test

Features

- 4x parallel test. Ultra-fast handling.
- No operator.
- Minimize the cost of test

Key Features

- 4x throughput with 4-Core Architecture
- No operator cost
- Ultra-fast handling in 3 sec.
- 5000+ tests/sec
- Automatic test program generation
- Parallel programming of different-type ICs
- Easy diagnostic of fixture’s pogo pins via mobile app

3030IL is the fully automatic bed-of-nails tester expressly designed to minimize the cost of test, providing unparalleled throughput without requiring the operator to load the PCB or perform the test. It can be quickly integrated into SMEMA production lines, or used with standard automatic board loaders/unloaders. Modular and fully upgradable, 3030IL combines a wide range of test capabilities in a unique, integrated, high-throughput, cost-effective system.
3030R
Zero-footprint board tester

Features
- Zero Footprint Design: maximize space & resources
- PC-independent Architecture
- The well-known 3030 series accuracy
- Easy to use: designed for untrained users

Key Features
- Zero Footprint Design
- Multi-Function Test Capabilities
- Ready to be integrated in any production line

Reduce the footprint to zero with SPEA 3030R In-Circuit tester. Designed to be integrated into third-party systems or 19” cabinet, or used manually with a minimum footprint. 3030R saves industrial floor and provides a comprehensive range of test capabilities to your production equipment, with unprecedented throughput.
Accuracy and full fault coverage are guaranteed: 3030R belongs to the SPEA 3030 series, which means 16-bit instrumentation, configurability and scalability according to your needs, and multiple test techniques integrated into a single test station.
Finally, integration into third-party systems brings more than space reduction: common elements such as mechanics and framework are spared, and the cost of test is further reduced.

Test Capabilities

- In-Circuit Test (Analog, Digital, Mixed)
- Power-On Test
- Functional Test
- Flashing via On-Board Programming
- Open Pin Scan
- Boundary Scan
- Built-In Self-Test
- Parametric Test
3030CE
Multi-core inline-compatible board tester.
High throughput. High coverage.

Key Features
- True 2x Parallel Test
- Fixture compatible with 3030 Inline
- High-speed parametric ICT
- Automatic application development
- Multiple test functions
- Easy diagnostic of fixture’s pogo pins via mobile app

Fully compatible with 3030 Inline.

3030CE is the bed-of-nails tester designed to deliver a cost-effective manual test solution fully compatible with 3030 Inline testers. Fixture, presser and test program can be quickly and easily moved from 3030CE to 3030 Inline and vice versa, without mechanical adjustments. Modular and configurable, 3030CE provides 2x throughput compared with standard test solutions, thanks to its 2-Core Real Parallel Test. 3030CE delivers multiple test capabilities, guaranteeing 100% coverage in a unique, integrated, high-throughput, cost-effective system.

Features
- True Parallel Test
- Fixture & Test Program migration to 3030 Inline
- PC-independent Architecture
- Multi-device Parallel Flashing
- Precise contacting with SPEA’s receivers
- Hi-speed parametric ICT

Test Capabilities

Cost-effective Per-Pin Architecture
Each 3030CE channel is configurable by test program. Every nail can be used to perform any kind of test. This instrument/receiver 1:1 ratio guarantees several benefits: faster test generation, easy ECO management, full flexibility.

Open Pin detection
Two different test techniques, Electro Scan and Junction Scan, can be executed for detecting open pins and other process defects in an easy and fast way.

Functional test
3030CE testers provide not only functional test (FCT) at board level but also at cluster level. Programming is easy with Leonardo OS and by means of high-level languages such as Microsoft C ++, Visual Basic, LabView.

Fully upgradable & customizable
3030CE can be factory-equipped or upgraded on field with the instrumentation useful to satisfy the test requirements. It is possible to integrate power instrumentation (as programmable AC/DC generators, Active Loads, Power Matrix, programmable Power Supplies etc.) as well as third party instruments to increase test capabilities and throughput. Finally, 3030CE can accommodate a wide range of fixture receiver models, also from third parties (Genrad, Ingun, Zentel, Augat Pylon…).

Boundary Scan: test inaccessible parts
The Boundary Scan technique is able to test non-accessible nets and components. The simultaneous use of Boundary Scan technique with SPEA 3030CE ICT instrumentation allows to increase the test coverage reducing in the same time the fixture costs (virtual test points instead of real test nails).
3030M
Multi-core multi-function board tester

High throughput. High scalability.
Full test coverage

Key Features
· -75% test cost with True Parallel Test
· Multifunction: full test coverage
· Fully customizable & upgradable
· Equippable with power instrumentation
· Automatic test program generation
· Parallel programming of different-type ICs
· Easy diagnostic of fixture’s pogo pins via mobile app

Features
- 4 Test Cores. True Parallel Test
- Multi-device Parallel Flashing
- PC-independent Architecture
- Fully upgradable & customizable
- Forget field returns

Multifunction test capabilities:
100% coverage with 1 system
3030M is the multi-function, fully upgradable and customizable ICT tester, expressly designed to combine full test coverage and the lowest cost of test into a unique manual test equipment. Modular and configurable with a wide range of instrumentation and receivers, 3030M provides 4x throughput compared with standard testers.

SAVE MONEY – Why buy several testers when you just need one? By using 3030M, multiple test techniques are executed within a unique system. Compared to multiple test stations, benefits are huge: no operator, a single test program, reduced industrial space, faster training and lower operational costs.

SAVE TIME – Test time is greatly reduced by 3030M. First of all, expensive and unnecessary handling operations are avoided. With just one board loading/unloading the tester executes different tests in a optimized way, in order to avoid redundancy and over-test of your product, thus allowing you to save precious time. And what about programming multiple devices? With 3030M and Leonardo OS you just need a few minutes to generate your multi-function test program.

SAVE FIELD RETURNS – 3030M has been designed to help electronics manufacturers to boost their product quality. By executing various test techniques with the same tester used for ICT, all risks related to subsequent handling operations are avoided. At the end of the test the product is ready to be delivered to the final customer.

Test Capabilities

Boundary Scan: test inaccessible parts
The Boundary Scan technique is able to test non-accessible nets and components. The simultaneous use of Boundary Scan technique with SPEA 3030M ICT instrumentation allows to increase the test coverage reducing at the same time the fixture costs (virtual test points instead of real test nails).

Open Pin detection
Two different test techniques, Electro Scan and Junction Scan, can be executed for detecting open pins and other process defects in an easy and fast way.

Functional test
3030M testers provide not only functional test (FCT) at board level but also at cluster level. Programming is easy with Leonardo OS and by means of high level languages such as Microsoft C ++, Visual Basic, LabView.

Cost-effective Per-Pin Architecture
Each 3030M channel is configurable by test program. Every nail can be used to perform any kind of test. This instrument/receiver 1:1 ratio guarantees several benefits: faster test generation, easy ECO management, full flexibility.

Hi-speed parametric ICT
3030M hi-speed ICT parametric test is able to measure each single component value in a very short time. Advantages: programming time reduction (the test is automatically generated), test time reduction (microseconds of ICT test vs. milliseconds of FCT), repairing time reduction (automatic fault device identification).

Fixture & Test Program migration
SPEA Common Architecture allows Leonardo OS test programs to work with all SPEA board test systems, 3030 and even Flying Probers. You can quickly move your production from one system to another, depending on the production needs.
T300 Automatic Board Tester
32x Ultra-High Parallelism In-Circuit Tester.

Full Parallel Test

SPEA T300 Board Tester is an unprecedented and unique architecture board test system that supports up to 32 parallel In-Circuit Test cores with additional capability of 256 cores for Flashing and Functional Test. This enables the T300 Asynchronous Parallel Architecture to perform tests and Flash in parallel up to 32 PCBAs (Printed Circuit Board Assemblies).
SPEA T300 bed of nails tester includes SPEA’s unique ICT-Plus test techniques which allow the detection of many defects present in electronics that are not detectable with traditional ICT testing.

Huge number of Test and Flashing in parallel

Most electronic printed circuit boards today are produced in panels composed of a high number of single boards (PCBAs), which in turn contain one or more components that need to be programmed.

The unique and unprecedented SPEA T300 bed of nails tester has been designed precisely to test and program a large number of boards in parallel or a large number of sections of a single big board. This enables high throughput and consequently very-low cost of testing and programming.

Programmable as Single or Dual Test Site. T300 can be programmed to operate as a Single Test Site or Dual Test Site.

- Single Test Site allows for testing of a single panel of boards for ICT, Flash Programming, and Functional test.
- Dual Test Site allows for testing of two panels of boards at the same time for ICT, Flash Programming, and Functional test. In order to double the throughput, the system is capable of performing a Split Test, such as, ICT in site 1 while simultaneously performing Flash Programming and/or Functional test on site 2.
PSV2800
Performance, Reliability, Value.

The PSV2800 delivers ultra-fast performance with industry-leading reliability for dedicated high-volume applications at the lowest total cost of ownership.

Programming Technology

FlashCORE III

At the core of all Data I/O's programming systems is the FlashCORE III programming engine. FlashCORE III is the industry’s most trusted universal programming engine with tens of thousands of devices supported.

- Read/write speeds greater than 10 MBytes per second (80 Mbits/s) for capable devices
- Fast downloads over 100 Base-T Ethernet connection
- Configurable FPGA for optimized programming now and in the future

Performance​
Engineered for speed & agility delivering maximum production throughput

- 3000 parts/hour​
- Scalable up to 6 FlashCORE III programming engines for up to 24 sockets​​​
- Integrated tape input and tape output​
- Supports devices from 2mm x 3mm​ up to 21.5mm x 21.5mm

Reliability
Designed for easy set-up & reliable performance

- Integrated systems software and handling technology for highest quality yield
- Simple UI minimizes operator error
- Supports up to two self-regulating ionizers to provide rapid elimination of ESD
- Highest programming yield up to 99.8%

Value
Delivering the lowest total cost of programming

- Scalable from 1-6 FlashCORE III programmers (4 to 24 sockets)​
- Thousands of devices supported
- Investment protection
PSV3500
Productive, Reliable, Affordable.

High-quality, automated programming system to deliver trusted performance at a great value. The PSV3500 is the cost-effective entry point for high-quality automated device programming for low-volume applications.

Productive
Ideal for first-time automation

- Handler rated up to 700 parts per hour​
- Scalable from 1 LumenX programmer (8 sockets)​ and up to 2 Flash CORE programmers (8 sockets)
- Integrated media options​
- Fiber laser marking​
- Small parts down to 2mm x 3mm up to 42mm x 42mm​

Reliable
Engineered for highest quality programming, uptime, and production yield

- Highest quality programming results
- Intelligent system design & integration​
- Proven pick and place head​
- Integrated vision system for precise placement​

Affordable
High-quality automated programming for the lowest cost per device

- Save up to 3x cost per programmed part
- Investment protection to meet future production requirements
- Lowest total cost of ownership

Programming Technology

LumenX
Ultra-fast programming delivering revolutionary performance, managed and secure programming at a revolutionary value. LumenX programming technology delivers:

FlashCORE III
At the core of all Data I/O's programming systems is the FlashCORE III programming engine. FlashCORE III is the industry’s most trusted universal programming engine with tens of thousands of devices supported.
PSV5000
Efficient, Reliable, Affordable
The PSV5000 is a cost-effective entry point for high-performance automated device programming. The PSV5000 delivers trusted performance, flexibility and reliability at an affordable price.

Efficient
Designed for Optimum performance

- Handler rated up to 1300 parts per hour​
-Scalable from 1 to 5 LumenX programmers (1 to 40 socket)​ or 1 - 6 FlashCORE programmers (4 to 24 sockets)
- Integrated media options​
- Fiber laser marking​
- Small parts down to 2mm x 3mm up to 42mm x 42mm​

Reliable
Engineered for highest quality programming, up-time & production yield​

- Highest quality programming results up to 99.8% yield
- Intelligent system design & integration​
- Proven pick and place head​
- Integrated vision system for precise placement​

Affordable
Developed to deliver high quality automated programming for the lowest cost per programmed device

- Up to 50% less cost per programmed part
- Investment protection to meet future production requirements
- Upgrade to SentriX for true security provisioning
- Lowest total cost of ownership
PSV7000
Velocity, Versatility, Value.
The world's premier automated programming system. The PSV7000 is engineered for speed and accuracy delivering blazing fast throughput, highest up-time, flexibility, and fast changeover to handle complex jobs at up to 50% lower cost.

Velocity
Engineered for speed and accuracy, the PSV7000 gives you blazing fast throughput and the highest uptime

- Up to 2000 devices/hour with tray, tape and tube
- Optimized throughput with Speed Factor
- Alignment-on-the-fly
- Zero mechanical changeover
- Simple, fast, and accurate teach with NexTeach Pro

Versatility
Designed for ultimate flexibility and zero changeover

- Small parts handling down to 1.5mm x 1.5mm
- Greatest socket density: scalable up to 14 LumenX programmer for up to 112 sockets or 24 FlashCORE III programmers for up to 96 sockets
- Concurrently installed media options including dual input tray feeder, tape & tube
- Ergonomic design for easy access
- Upgrade to SentriX for true security provisioning

Value
The PSV7000 delivers unprecedented capability & quality for the lowest total cost of ownership

- Up to 50% less cost per programmed part
- Investment protection to meet future production requirements
- Lowest total cost of ownership

Programming Technology
LumenX
Ultra-fast programming delivering revolutionary performance, managed and secure programming at a revolutionary value. LumenX programming technology delivers

FlashCORE III
At the core of all Data I/O's programming systems is the FlashCORE III programming engine. FlashCORE III is the industry’s most trusted universal programming engine with tens of thousands of devices supported.
FlashRunner LAN 2.0 NXG
FlashRunner 2.0 technology is revolutionary not only for its performances in terms of fast programming speed, but also for the technological leap that it represents, introducing the concept of production efficiency.
SMH is exclusively focused on technology for the programming of microcontrollers and memories: its decennial experience led to the evolution from a simple programming tool to an actual programming system which finalizes and completes FlashRunner’s performance.

Control
- Production control panel
- Programming times and statistics
- Interface libraries
- Connections pinout

Command
- Project wizard
- File transfer management
- Firmware and software updates
- Windows, Linux and Mac compatible GUI software interface

Security
- Encrypted FRB files to avoid binary hacking
- Dump and compare features of all channels
- LOG file and Production Report file
- User Permission Management
- Tracking of programming cycles number
- Errors with language descriptions

Software Features
FlashRunner 2.0 is based on Linux Embedded operating system, which relays on a real time scheduler and a full featured hardware abstraction layer.
FlashRunner 2.0 is featured with software interfacing libraries which enables customers to achieve a full integration inside their software and across different frameworks, as LabView© and Visual C/C++.

A new, friendly and interactive GUI (Graphic User Interface) which cut off overall configuration efforts, guiding customers creating a working project in few mouse clicks and detecting mismatches between target device and customer firmware, as well as power supply setup.

Hardware Features
- Easy fixture integration thanks to the compact size: 142×17,6x70mm;
- Independent ISP channels supporting several communication protocols (JTAG, SPI, I2C, BDM, UART…);
- 8 digital I/O lines for each channel, coupled with dedicated ground return lines;
- Two programmable output voltage lines;
- 1 GB on-board Dynamic Memory;
- On-board timekeeper and calendar for time-stamped log file;
- Fast Ethernet interface up to 1 Gbit/s (optoisolated, autocrossing feature);
- USB-UART communication interface (optoisolated);
- Fixture dedicated Control interface for standalone mode (optoisolated);
- Power voltage and current measurement for each channel;
- Integrated control for optional Relay Barrier tool;
- Two 48-pin DIN In-System Programming connectors;
- eMMC and NAND memory support:
- Up to 256 GB storage memory;
- Operation status LEDs for each channel;
- USB communication interface (optoisolated).
3030T
Functional End-of-Line Testers

- Cost-effective high-reliability functional test
- Multifunction test capabilities for unmatched coverage
- Wide configurability, full modularity
- Compact & ergonomic design

3030T is the new compact tester expressly designed to provide a cost-effective high-coverage functional test of electronic boards and modules.

Standard systems, configurable at will according to the test needs. Or made ad hoc, to meet specific customer needs.
SPEA functional testers are used worldwide for functional testing of finished electronic modules and devices.
Electronic modules, power supplies, inverters, PLCs, smartphones, automotive control units, motor control units are just a few examples of the different applications of this product range.
FlashRunner High-Speed
FlashRunner High-Speed combines high-level programming performances and high modularity to obtain a Multi-end programming solution that fits the needs of Pre-Programming and In-System Programming equipment.

The HS Control Unit is the central management which coordinates different technologies for each peripheral Active Module: this organization reflects the Industry 4.0 concept, where a central intelligence creates smart networking and parallel independent process management, reaching high quality levels and optimizing the production process.

The possibility to place the Active Module close to the target devices cuts any distance between the programming system and customer’s board, guaranteeing optimal signal integrity.

Thanks to the high communication frequency, this new member of the FlashRunner family allows to manage big-size data files with up to 80MB/s transfer rate speed, guaranteeing the highest programming performance. This system perfectly complies with the major needs not only of the production lines, but widely involves the whole process management (production quality control, permission management, hacking prevention… etc.).

Control
- Programming cycle time
- Easy wire-wrapping with pinout manager
- Log file Production
- Control Report
- FRB Conversion Report
- Voltage Monitor
- Production batch counter

Command
- Graphical User Interface
- File transfer Management
- One-click driver updates
- Windows and Linux compatible GUI software Interface
- DLL interface libraries for C/C++/C#/Labview/Teststand
- Command line tools

Security
- Encrypted FRB files to avoid binary hacking
- Dump and Compare features of all channels
- User Permission Management
- NDA device management
- FRB integrity check through CRC calculation

Software Features
- Watchdog feeder: square wave generator, frequency trimmable, feeding on-board watchdog;
- Cybersecurity: firmware encryption and secure data transfer;
- DLL (C,C++,C#), easy integration with Teststand/Labview/CVI;
- Voltage Monitor: overvoltages and undervoltages detection during flashing process;
- Serial Numbering: dynamic data flashing, runtime defined;
- Digital lines shuffling: dynamic pinout management;
- Conditional erase: decrease cycle time by adding this option to erase only if device is not blank;
- Online driver knowledgebase: complete online Wiki, daily updated, online video lectures, troubleshooting articles.
TestWay Express
Design for Test and Test Coverage Analyzer

TestWay Express is an integrated DfT and Test Coverage Analysis software that enables designers and manufacturers to prevent and detect defects from design to production.

Test coverage analysis software
- TestWay Express operates from native CAD formats and is powered by QuadView visualization.
- Electrical rules checking enables the identification and rectification of electrical rules violations, before finalizing the board layout.
- Probe analyzer automates probe placement with a comprehensive set of rules to define priorities, clearances and constraints and generate detailed accessibility reports.
- The software simulates test strategies using test machine models to maximize test coverage and optimize test programs to minimize redundancy between strategies.
- The theoretical models estimate the test coverage of each individual stage (SPI, AOI, X-Ray, Boundary scan [BST], In-circuit [ICT], Flying probe [FPT] and Functional test) and optimize the combined results.
- TestWay Express generates the output files, aligned on the simulation results, for programming the assembly, test and inspection machines.
- By importing the post-debug test programs, test engineers can measure the actual coverage and compare this against the early estimation, to identify gaps in the overall strategy.
- twSystem is an add-on module to extend the PCBA viewing and analysis at system level.

Improve product quality
TestWay Express improves product quality by striving to detect and prevent all faults on a product. It analyzes the number of defects detected at each stage in the test process and identifies any shortfall in test coverage.