SNAP VISION L SEMICONDUCTOR

MSTECH Europe
[SNAP VISION]

Multi-purpose vision engine for ultra-high speed inspection.

SNAP VISION L semiconductor.
In-line 2D Automated Optical Inspection (AOI) system for real-time quality control in production environments.
It can be integrated into MSTECH Europe units or third-party machines.

MODEL:
Inspection Area (FOV): 300 x 130 mm.
- Working Distance: 490 mm
- Resolution: 24 μm.
Application: High-resolution inspection for semiconductor and fine-feature detection in compact dual lane configurations.

VISION TECHNOLOGY:
- Intuitive programming UI.
- Typical inspection time: under 4 seconds, depending on the application.
- Coatings thickness trend verification.
- UV traceable.
- Light source: multi-LED illumination.
- No periodical camera calibration needed.
- AI based diagnosis.
- Proactive analysis engine.
- Industry 4.0 MES/FIS and Data sharing.
- Fixed inline AOI module
- Single or dual lane configuration.
- Industrial rigid structure for vibration stability.
- Precision optical alignment.