3030CE

Multi-core inline-compatible board tester.
High throughput. High coverage.

Key Features
- True 2x Parallel Test
- Fixture compatible with 3030 Inline
- High-speed parametric ICT
- Automatic application development
- Multiple test functions
- Easy diagnostic of fixture’s pogo pins via mobile app

Fully compatible with 3030 Inline.

3030CE is the bed-of-nails tester designed to deliver a cost-effective manual test solution fully compatible with 3030 Inline testers. Fixture, presser and test program can be quickly and easily moved from 3030CE to 3030 Inline and vice versa, without mechanical adjustments. Modular and configurable, 3030CE provides 2x throughput compared with standard test solutions, thanks to its 2-Core Real Parallel Test. 3030CE delivers multiple test capabilities, guaranteeing 100% coverage in a unique, integrated, high-throughput, cost-effective system.

Features
- True Parallel Test
- Fixture & Test Program migration to 3030 Inline
- PC-independent Architecture
- Multi-device Parallel Flashing
- Precise contacting with SPEA’s receivers
- Hi-speed parametric ICT

Test Capabilities

Cost-effective Per-Pin Architecture
Each 3030CE channel is configurable by test program. Every nail can be used to perform any kind of test. This instrument/receiver 1:1 ratio guarantees several benefits: faster test generation, easy ECO management, full flexibility.

Open Pin detection
Two different test techniques, Electro Scan and Junction Scan, can be executed for detecting open pins and other process defects in an easy and fast way.

Functional test
3030CE testers provide not only functional test (FCT) at board level but also at cluster level. Programming is easy with Leonardo OS and by means of high-level languages such as Microsoft C ++, Visual Basic, LabView.

Fully upgradable & customizable
3030CE can be factory-equipped or upgraded on field with the instrumentation useful to satisfy the test requirements. It is possible to integrate power instrumentation (as programmable AC/DC generators, Active Loads, Power Matrix, programmable Power Supplies etc.) as well as third party instruments to increase test capabilities and throughput. Finally, 3030CE can accommodate a wide range of fixture receiver models, also from third parties (Genrad, Ingun, Zentel, Augat Pylon…).

Boundary Scan: test inaccessible parts
The Boundary Scan technique is able to test non-accessible nets and components. The simultaneous use of Boundary Scan technique with SPEA 3030CE ICT instrumentation allows to increase the test coverage reducing in the same time the fixture costs (virtual test points instead of real test nails).