ENIF2

ENIF2-Standalone (XRD)
ENIF2-Benchtop (XRD)

X-ray diffractometer
Structure of sample Non-destructive analysis equipment

Analysis

– X-ray diffraction

– Checking lattice constant from wavelength

– Applied new material synthesis, thin film deposition

– Checking lattice constant from angle

X-ray Tube 30kV / 10mA
Goniometer Geometry(2axis) Theta, 2 Theta
Software Data collection