Device-Oriented

MEMS Device-Oriented Testers
We put a tester in the size of a postcard

Cost per pin < 100 USD
Dedicated CPU per DUT
Single card with all A/D resources to test a DUT
Up to 1,152 Analog/Digital channels
Integration into MEMS stimulus, hard/soft docking with handler/prober, benchtop use

Are your test requirements oriented to defined families of devices, with common characteristics? You do not need to purchase an expensive, general-purpose mixed signal tester: You can rely on SPEA DOT 100, a system designed to answer the test requirements of MEMS and other low-pin-count devices at an incredibly low cost.

The DOT 100 is based on a revolutionary per-device architecture: each device under test has a dedicated CPU managing the entire test process, while each card hosts all the resources for the parallel test of 6 devices, in the size of a postcard.

All this is contained in a hand-carryable size, which can be integrated in the SPEA MEMS stimulus, hard/soft docked with prober or handler, or used as benchtop unit.

Multi-site Fast parallel Test

Ultra high density Pin Electronics

Test Program Generation & Debug < 1 day

Multi-site Fast parallel Test

– dedicated CPU per device
– up to 1,152 Analog/Digital channels
– device power supply and time
measurement unit per device
– pattern memory per channel (30 Mstep)
– asynchronous digital capabilities
– programmable logic units (SPI, I2Cbus, Uart, IO Port)

Ultra high density Pin Electronics

At the core of DOT testers is the pin  electronics, which provides 48/96 channels in 3/6 independent sections.

Each section contains:

– 8 digital channels @5MHz & 8 analog channels (DPS) up to 10V; 256mA
– 8 digital channels @50MHz + 1 analog
channel (driver and digitizer multiplexed)
– 2 time meaurement units

Test Program Generation & Debug < 1 day

– Easy-to-learn programming environment
– Guided Test Program generation
– The Automatic code generation dramatically
shortens the time taken to develop, debug and
release the program,
– Automatic data import
– DUT-Oriented & Instrument-Oriented instruction
Libraries
– DUT Map
– Very Rapid Appllication Development
– Test Result Analyzer
– Shmoo Plot
– Easy to run. Easy to monitor. Easy to maintain.