Analog

Analog Mixed Signal Testers

The cost-efficient multi-site production test

Floating architecture
Analog pin performance
Digital pin performance
Signal processing instruments
High-voltage, hi-current instruments

Migrating to SPEA Comptest

Parallelism 2x
Test Time 1/2
Save 50%
of handlers and probers

Floating Architecture

Analog Pin Performance

Digital Pin Performance

Signal Processing Instruments

High Voltage, High Current Instruments

Test program generation & debug <1 day

Floating Architecture

– PC-performance independent: multiple SPEA CPUs
provide test program timing, while pc replacement does
not require the test program requalification
– Multi-Core Architecture: possibility to develop and run 2 independent test programs simultaneously, in asynchronous way
– Pattern-based programming: -30% test time vs
competitors
– 64-line synchrobus and 16-line high-speed synchrobus for
real-time instrument synchronization: no embedded delay
when running pattern-based testing
– 99% parallel test efficiency
– Multi-site test capabilities for up to 256 devices in parallel
– High-density, floating instruments, for true parallel analog
test
– Universal slot architecture, up to 1,408 channels
– RF generators up to 3 GHz

Analog Pin Performance

– 1 SPEA board takes the place of 4 competitor boards
– Totally floating, independent for sensing/forcing per channel
– Wide V/I range: ±100V / ±1A, ±20V / ±2A, ±20V / 500mA
– 32 DVM digitizers into Readback, totally independent
and independently floating
– 8 DVMs available on interface to measure on different
points from the sourcing ones
– Clamp alarms, spike detector, automatic ramp generators
– Arbitrary Waveform Generators and Time Measurement
Units per channel

Digital Pin Performance

– Test time for timing measurement is 1/8 than competitors
for digital data calculation and protocol management
– 200 MHz frequency
– 16 M Pattern memory
– Voltage range -2 to +6.5V or -2 to 14V
– Active load integrated in the digital pin
– Integrated DPS (-2 to +24V, ±500mA)
– 8 integrated Timing Measurement Units (with possibility
of multiple time measurements on the same channel)
– Integrated Programmable Logic Units

Signal Processing Instruments

– Octal Digitizer & DSP for real time data acquisition
& processing: 16 bit HF, 24 bit Audio BW
– Quad AC generators: 14 bit HF, 20 bit Audio BW
– Selectable low pass analog filters
– Integrated DSPs for fast signal processing
– Waveform generator with high-accuracy audio section
and possibility to generate custom waveforms
– Counter, for time measurements on high-voltage signals
(±100V)and non-periodic signals – one-shot timing
measurements

High Voltage, High Current Instruments

– 8 high current sources: 1000 A pulsed or 20 A continuous
– 8 high voltage sources: ±2500 V
– Insulation guaranteed at test head interface
(instruments housed in the instrument cabinet)
– High-voltage and high-current generators designed
by SPEA
– Embedded CPUs for safety control and fast programming
– Clamp alarms, spike detector, automatic ramp generators

Test program generation & debug <1 day

– Easy-to-learn programming environment
– Guided Test Program generation
– The Automatic code generation dramatically
shortens the time taken to develop, debug
and release the program
– Automatic data import
– DUT-Oriented & Instrument-Oriented
instruction Libraries
– DUT Map
– Very Rapid Appllication Development
– Test Result Analyzer
– Shmoo Plot
– Easy to run. Easy to monitor. Easy to mantain.